Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Applied Surface Science
سال: 2008
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2008.05.018